Pii: S0921-4526(99)01939-0
نویسندگان
چکیده
X-ray and electron di!raction have been used to determine the surface roughness parameters of thin "lms and thus evaluate roughness e!ects on magnetic properties. For self-a$ne roughness, the demagnetizing factor is in#uenced by the roughness exponent H, and is proportional to w/m2 with w being the RMS roughness amplitude and m being the lateral correlation length. Roughness anisotropy can amplify in-plane demagnetising factors. Roughness can also in#uence the coercivity through the RMS local surface slope. ( 2000 Elsevier Science B.V. All rights reserved.
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